VLSI Design & Technology Test Questions


Q.  Why is multiple stuck-at fault model preferred for DUT?

a. Because single stuck-at fault model is independent of design style & technology
b. Because single stuck-at tests cover major % of multiple stuck-at faults & unmodeled physical defects
c. Because complexity of test generation is reduced to greater extent in multiple stuck-at fault models
d. All of the above



 
 

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