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MCQs: Which among the below mentioned assertions is not a reason responsible for the occurrence of fading?
Category: Electronic Engineering Questions, Published by: teswesm
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MCQs: What is the range of SINAD numbers associated with the threshold for reasonable intelligibility of voice especially in SINAD measurement system?
Category: Electronic Engineering Questions, Published by: teswesm
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MCQs: Which among the design characteristics of MUX specifies that the two channels can never be connected instantaneously?
Category: Electronic Engineering Questions, Published by: teswesm
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MCQs: The requisite amount of time for output in order to track an input within the specific error band after delivering the sample command while designing sample and hold circuitry is known as ___________
Category: Electronic Engineering Questions, Published by: teswesm
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MCQs: Which type of voltage regulator exhibits an excessive power dissipation in a series pass transistor?
Category: Electronic Engineering Questions, Published by: teswesm
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MCQs: The method used for screening of products along with the design evaluation in order to catch early-term latent defects is renowned as Environmental Stress Screening (ESS) or __________
Category: Electronic Engineering Questions, Published by: teswesm
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MCQs: Bump is basically the force experienced by a product since it is bounded on a _______
Category: Electronic Engineering Questions, Published by: teswesm
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MCQs: Which type of test chamber style in an environmental testing has a provision of access through door so as to reach and handle the contents of chamber?
Category: Electronic Engineering Questions, Published by: teswesm
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MCQs: Which actions must be undertaken over the souring consequences of finishes in the vibration type of enclosure testing?
Category: Electronic Engineering Questions, Published by: teswesm
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MCQs: In mechanical shock type of an enclosure testing, the usability of materials with high tensile strength is necessary for overcoming the effect of __________
Category: Electronic Engineering Questions, Published by: teswesm
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MCQs: NEMA-4X standard excogitates its applications in _______
Category: Electronic Engineering Questions, Published by: teswesm
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MCQs: Which IEC standard plays an important role in measuring an ability of an equipment in order to tolerate the transients associated with switching and lightning?
Category: Electronic Engineering Questions, Published by: teswesm
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MCQs: How does the burden of legal liabilities get reduced in the process of documentation?
Category: Electronic Engineering Questions, Published by: teswesm
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MCQs: Which type of maintenance is associated or concerned with an elimination of failures during the operational level of an equipment?
Category: Electronic Engineering Questions, Published by: teswesm
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MCQs: On which factors does the down-time of an equipment at the maintainability phase, depend?
Category: Electronic Engineering Questions, Published by: teswesm
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MCQs: What would happen, if an equipment possesses reliability and maintainability to the maximum extent in accordance to MTTR?
Category: Electronic Engineering Questions, Published by: teswesm
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MCQs: What would be the composite failure rate of a system comprising one VLSI microprocessor with 6 SSI ICs and 10 resistors corresponding to the data given below?
Assume a single board system
PCB 2000 FIT
SSIC 70 FIT
R 20 FIT
VLSI microprocessor 600 FIT
Category: Electronic Engineering Questions, Published by: teswesm
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MCQs: Which type of availability deals with the probability of system operation and functioning at the requisite level in an ideal environment without any consideration of maintenance?
Category: Electronic Engineering Questions, Published by: teswesm
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MCQs: Which op-amp device serves to be an ideal application for differential as well as instrumentation amplifier?
Category: Electronic Engineering Questions, Published by: teswesm
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MCQs: Which methods are adopted to improve CMRR in three op-amp instrumentational amplifier?
Category: Electronic Engineering Questions, Published by: teswesm
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